Electron transport measurements
on nanotubes and nanowires.
Carbon nanotubes are a novel material
that has became an object of intensive research activity. With the diameter
on the order of 1 nm and large aspect ratios nanotubes effectively are one-dimensional
nanostructures, and that adds to their electron transport properties such
effects as nonlinear conductance, Luttinger liquid behavior and Coulomb
blockade. It has been shown that electronic devices made of individual carbon
nanotubes can act as conducting wires, field-effect transistors and simple
logic elements – all that contributing to the progress of single-molecule
electronics.
In our group we study electron
transport in single-walled carbon nanotubes (SWNTs). Through collaboration
with Prof. Jie Liu’s group (Duke, Department of Chemistry) we are getting
samples of SWNTs grown by a novel CVD method on an oxidized doped Si substrate.
We attach contacts to the ends of the SWNTs by electron beam lithography.
Two-terminal conductivity of a number of samples with different quality
of the contacts has been measured at room and liquid nitrogen temperatures.
The latest experiments were carried out in liquid 4He cryostat system at
~1.3K and magnetic fields up to 8 Tesla.
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Fig.1A. AFM image of a contacted SWNT
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Fig 1B. SEM image
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Some our preliminary results
Experimental
observations have been made that agree with a number of both theoretical
predictions and published experimental results. Depending on the tube’s chirality
(which is defined by the vector connecting two atoms of 2D-graphite sheet
that coincide when the cylinder is formed) SWNTs can be metallic or semiconducting.
Both the former and the later ones were studied: the response to the application
of gate voltage Vg to the Si substrate (Fig.2A) made it possible to distinguish
between these two kinds of SWNTs during the measurement. The gate voltage
does not noticeably affect conducting properties of the metallic tubes.
In case of the semiconducting samples conductivity decreases by many orders
of magnitude when positive gate voltage is applied (Fig.2B), consistent with
p-type doping of the tube by absorbed oxygen. For two large metal terminals
on the Si substrate surface connected by multiple SWNTs the difference in
gating behavior provides a way to get rid of all
connections by metallic tubes. Only metallic nanotubes carry
current when there is a high positive voltage on the gate, and thus only
they are subjected to electrical breakdown when the bias voltage V exceeds
some limit
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Fig. 2A. Nanotube device schematic
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Fig. 2B. dI/dV vs. gave voltage for a nanotube device
at 77K
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Cooling the samples down to 1.3K
allows access the regime when temperature is lower than single-electron charging
energy of the nanotube. For the samples with not-so-good contact quality,
where effectively tunneling barriers separate SWNT and metal leads, Coulomb
blockade oscillations have been observed (Fig. 3A). The measurements show
that the location of the centers of the peaks along Vg axis is close to
periodic (Fig. 3B) as in the case of a single quantum dot. This result may
mean that the tube does not contain strong structural imperfections, which
would effectively divide it into a number of short sections each behaving
as an individual quantum dot. From the charging energy value taken from Fig
.2B the length of the section of the nanotube available for added electrons
was estimated. The fact that the estimated length equals to the length of
the SWNT between the metal contacts means that the tube is effectively cut
by the contacts.
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Fig. 3A. dI/dV vs. gave voltage at 1.3K. Coulomb
blackede oscillations can be observed
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Fig. 3B. Data on Fig .(3A) suggests reasonable peak
periodicity
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Publications
B. Zheng,
C. Lu, G. Gu, A. Makarovski, G. Finkelstein and J. Liu, Nano Lett. 2, 895-898
(2002).
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group.