Stephen W. Teitsworth
Steering most probable escape paths by varying relative noise intensities.
Physical review letters (2014)
Measurement of anomalous scaling behavior associated with noise-induced current switching in a tunnel diode
Dependence of switching path distributions on relative noise intensities in a model of electrical conduction in a tunnel diode circuit
Steering Most Probable Escape Paths by Varying Relative Noise Intensities
Physical Review Letters (2014)
On the Origin of Power-Law Probability Distributions Associated with Noise-Induced Current Switching in Semiconductor Superlattices
to be submitted to Physical Review B (2014)
Steering most probable escape paths by varying relative noise intensities
Shot Noise Amplification in Weakly-Coupled Semiconductor Superlattices
Rare transition events in non-equilibrium systems with state-dependent noise: application to stochastic current switching in semiconductor superlattices
Noise-Induced Current Switching in Semiconductor Superlattices: Observation of Nonexponential Kinetics in a High-Dimensional System
Physical Review Letters (2012)
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Prof. Stephen W. Teitsworth's research centers on experimental, computational, and theoretical studies of deterministic and stochastic nonlinear electronic transport in nanoscale systems. Three particular areas of current interest are: 1) stochastic nonlinear electronic transport phenomena in semiconductor superlattices and tunnel diode arrays; 2) complex bifurcations associated with the deterministic dynamics of electronic transport in negative differential resistance systems; and 3) strategies for stabilizing negative differential resistance systems against the formation of space-charge waves.
A.M. - Harvard University
BS - Stanford University
Controllable bifurcation processes in undoped, photoexcited GaAs/AlAs superlattices
In Proceedings of the 5th experimental chaos conference edited by M. Ding et al.. ; : .
Quantum chaos effects in mechanical wave systems
In Proceedings of the 16th Sitges conference edited by D. Reguera et al.. ; : .